Cite
APA Citation
Viale, B., Fer, M., Courau, L., Galy, P., & Allard, B. (2016). on the need for a new ESD verification methodology to improve the reliability of ICs in advanced 28nm UTBB FD-SOI technology. Microelectronics and reliability, 64, 101–108. http://access.bl.uk/ark:/81055/vdc_100038472167.0x000031