Cite
APA Citation
Simon-Najasek, M., Lorenz, G., Lindner, A., & Altmann, F. (2016). novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions. Microelectronics and reliability, 64, 248–253. http://access.bl.uk/ark:/81055/vdc_100038472167.0x00001e