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MLA Citation
Sayani Ghosh et al.. “Study of process induced variability of germanium-pTFET in analog and RF domain.” Microelectronics and reliability, vol. 65, 2016, pp. 47–54. http://access.bl.uk/ark:/81055/vdc_100038472186.0x000050
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Sayani Ghosh et al.. “Study of process induced variability of germanium-pTFET in analog and RF domain.” Microelectronics and reliability, vol. 65, 2016, pp. 47–54. http://access.bl.uk/ark:/81055/vdc_100038472186.0x000050