Cite
MLA Citation
Yongkun Sin et al.. “Reliability and Degradation Mechanisms in High Power Broad-Area InGaAs-AlGaAs Strained Quantum Well Lasers.” MRS proceedings, no. 1792, 2015, p. . http://access.bl.uk/ark:/81055/vdc_100029266679.0x00002d
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Yongkun Sin et al.. “Reliability and Degradation Mechanisms in High Power Broad-Area InGaAs-AlGaAs Strained Quantum Well Lasers.” MRS proceedings, no. 1792, 2015, p. . http://access.bl.uk/ark:/81055/vdc_100029266679.0x00002d