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APA Citation
Jana, S. K., Ghosh, S., Dinara, S. M., Chakraorty, A., & Biswas, D. (2015). comparative High-Resolution X-Ray Diffraction Analysis of GaN/AlGaN Heterostructure on Al2O3 and Si (111) Substrate Grown by Plasma Assisted Molecular Beam Epitaxy. MRS proceedings, (1754), . http://access.bl.uk/ark:/81055/vdc_100029198487.0x00005a