Cite
MLA Citation
T. Mudgal et al.. “Study of Back-Channel Defect States on Bottom-Gate IGZO TFTs Using Capacitance-Voltage Analysis.” MRS proceedings, no. 1731, 2015, p. . http://access.bl.uk/ark:/81055/vdc_100029198364.0x000017
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T. Mudgal et al.. “Study of Back-Channel Defect States on Bottom-Gate IGZO TFTs Using Capacitance-Voltage Analysis.” MRS proceedings, no. 1731, 2015, p. . http://access.bl.uk/ark:/81055/vdc_100029198364.0x000017