Cite
HARVARD Citation
Mudgal, T. et al. (2015). Study of Back-Channel Defect States on Bottom-Gate IGZO TFTs Using Capacitance-Voltage Analysis. MRS proceedings. p. . [Online].
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Mudgal, T. et al. (2015). Study of Back-Channel Defect States on Bottom-Gate IGZO TFTs Using Capacitance-Voltage Analysis. MRS proceedings. p. . [Online].