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APA Citation
Preissler, N., Töfflinger, J. A., Shutsko, I., Gabriel, O., Calnan, S., Stannowski, B., Rech, B., & Schlatmann, R. (n.d.). interface passivation of liquid‐phase crystallized silicon on glass studied with high‐frequency capacitance–voltage measurements. Physica status solidi, 213(7), 1697–1704. http://access.bl.uk/ark:/81055/vdc_100034750045.0x00002d