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APA Citation
Li, C., Kiss, A. M., Van Campen, D. G., Garachtchenko, A., Kolotovsky, Y., Stone, K., Xu, Y., Zhang, W., & Corbett, J. (2016). continuous‐scan capability at SSRL and applications to X‐ray diffraction. Journal of synchrotron radiation, 23, 909–918. http://access.bl.uk/ark:/81055/vdc_100034751096.0x000033