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APA Citation
Esaka, F., Nojima, T., Udono, H., Magara, M., & Yamamoto, H. (2016). non‐destructive depth analysis of the surface oxide layer on Mg2Si with XPS and XAS. Surface and interface analysis, 48, 432–435. http://access.bl.uk/ark:/81055/vdc_100034054741.0x000048