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APA Citation
Le, C. V. (2016). yield-stress based error indicator for adaptive quasi-static yield design of structures. Computers & structures, 171, 1–8. http://access.bl.uk/ark:/81055/vdc_100032636478.0x000050
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Le, C. V. (2016). yield-stress based error indicator for adaptive quasi-static yield design of structures. Computers & structures, 171, 1–8. http://access.bl.uk/ark:/81055/vdc_100032636478.0x000050