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HARVARD Citation
Yu, Z. et al. (2016). Comparative study of reliability degradation behaviors of LDMOS and LDMOS-SCR ESD protection devices. Microelectronics and reliability. pp. 111-114. [Online].
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Yu, Z. et al. (2016). Comparative study of reliability degradation behaviors of LDMOS and LDMOS-SCR ESD protection devices. Microelectronics and reliability. pp. 111-114. [Online].