Cite
HARVARD Citation
Schäfer, N. et al. (2016). Microstrain distributions in polycrystalline thin films measured by X‐ray microdiffraction. Journal of applied crystallography. 49 (2), pp. 632-635. [Online].
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Schäfer, N. et al. (2016). Microstrain distributions in polycrystalline thin films measured by X‐ray microdiffraction. Journal of applied crystallography. 49 (2), pp. 632-635. [Online].