Microstrain distributions in polycrystalline thin films measured by X‐ray microdiffraction. Issue 2 (18th March 2016)

• Record Type: Journal Article
• Authors: Schäfer, N.; Chahine, G. A.; Wilkinson, A. J.; Schmid, T.; Rissom, T.; Schülli, T. U.; Abou-Ras, D.
• Is Part Of: Journal of applied crystallography. Volume 49:Issue 2(2016)
• Page Start: 632
• Page End: 635
• Publication Date: 2016-03-18
• Subjects: microstrain distribution -- X‐ray microdiffraction -- polycrystalline thin films; Crystallography -- Periodicals; 548.05
• DOI: 10.1107/S1600576716003204
• Languages: English
• ISSNs: 0021-8898

Abstract

Abstract : X‐ray microdiffraction is used for acquiring microstrain distribution maps in polycrystalline thin films. Abstract : Microstrain distributions were acquired in functional thin films by high‐resolution X‐ray microdiffraction measurements, using polycrystalline CuInSe2 thin films as a model system. This technique not only provides spatial resolutions at the submicrometre scale but also allows for analysis of thin films buried within a complete solar‐cell stack. The microstrain values within individual CuInSe2 grains were determined to be of the order of 10 −4 . These values confirmed corresponding microstrain distribution maps obtained on the same CuInSe2 layer by electron backscatter diffraction and Raman microspectroscopy.