Cite
HARVARD Citation
de Pablos-Martín, A. et al. (n.d.). Structural Characterization of Laser Bonded Sapphire Wafers Using a Titanium Absorber Thin Film. Journal of materials science & technology. 31 (5), pp. 484-488. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
de Pablos-Martín, A. et al. (n.d.). Structural Characterization of Laser Bonded Sapphire Wafers Using a Titanium Absorber Thin Film. Journal of materials science & technology. 31 (5), pp. 484-488. [Online].