Cite
APA Citation
Postava, K., Sýkora, R., Legut, D., & Pištora, J. (2016). determination of Anisotropic Crystal Optical Properties Using Mueller Matrix Spectroscopic Ellipsometry. Procedia materials science, 12, 118–123. http://access.bl.uk/ark:/81055/vdc_100032178083.0x000005