Cite
HARVARD Citation
Baer, D. et al. (2016). Use of XPS to Quantify Thickness of Coatings on Nanoparticles. Microscopy today. pp. 40-45. [Online].
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Baer, D. et al. (2016). Use of XPS to Quantify Thickness of Coatings on Nanoparticles. Microscopy today. pp. 40-45. [Online].