Use of XPS to Quantify Thickness of Coatings on Nanoparticles. (18th March 2016)

Record Type:: Journal Article
Title:: Use of XPS to Quantify Thickness of Coatings on Nanoparticles. (18th March 2016)
Main Title:: Use of XPS to Quantify Thickness of Coatings on Nanoparticles
Authors:: Baer, Donald R.
Wang, Yung-Cheng
Castner, David G.
Abstract:
Is Part Of:: Microscopy today. Volume 24:Number 2(2016)
Journal:: Microscopy today
Issue:: Volume 24:Number 2(2016)
Issue Display:: Volume 24, Issue 2 (2016)
Year:: 2016
Volume:: 24
Issue:: 2
Issue Sort Value:: 2016-0024-0002-0000
Page Start:: 40
Page End:: 45
Publication Date:: 2016-03-18
Subjects:: Microscope and microscopy -- Periodicals
502.8
Journal URLs:: http://www.microscopy-today.com/ ↗
https://academic.oup.com/mt ↗
http://journals.cambridge.org/action/displayJournal?jid=MTO ↗
http://www.microscopy-today.com/jsp/mto/common/home.faces ↗
DOI:: 10.1017/S1551929516000109 ↗
Languages:: English
ISSNs:: 1551-9295
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD Digital store
Ingest File:: 1161.xml