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APA Citation
Megalini, L., Shenoy, R., Rose, K., Speck, J. P., Bowers, J. E., Nakamura, S., Cohen, D. A., & DenBaars, S. P. (n.d.). estimation of roughness‐induced scattering losses in III‐nitride laser diodes with a photoelectrochemically etched current aperture (Phys. Status Solidi A 4∕2016). Physica status solidi, 213(4), 1096. http://access.bl.uk/ark:/81055/vdc_100031856710.0x00000b