Cite
MLA Citation
X.Y. Wang et al.. “Improvement of reliability for high-ohmic Cr–Si thin film resistors in a heat and humid environment: Removing moisture source by electrocatalytic decomposition of water.” Microelectronics and reliability, vol. 60, 2016, pp. 101–108. http://access.bl.uk/ark:/81055/vdc_100031729226.0x000055