Cite
HARVARD Citation
Cowley, A. et al. (2016). B-Spline X-Ray Diffraction Imaging — Rapid non-destructive measurement of die warpage in ball grid array packages. Microelectronics and reliability. pp. 108-116. [Online].
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Cowley, A. et al. (2016). B-Spline X-Ray Diffraction Imaging — Rapid non-destructive measurement of die warpage in ball grid array packages. Microelectronics and reliability. pp. 108-116. [Online].