An improved modeling for life prediction of high-power white LED based on Weibull right approximation method. (April 2016)

• Record Type: Journal Article
• Authors: Zhang, Jianping; Chen, Wenlong; Wang, Chen; Chen, Xiao; Cheng, Guoliang; Qiu, Yingji; Wu, Helen
• Is Part Of: Microelectronics and reliability. Volume 59(2016)
• Page Start: 49
• Page End: 54
• Publication Date: 2016-04
• Subjects: Life prediction -- High-power white light LED (HPWLED) -- Weibull right approximation luminance degradation model (WRALDM) -- Error correction -- Confidence interval; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2015.12.040
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: Aiming at precisely predicting the life of the high-power white light LED (HPWLED), a three-parameter Weibull function and the right approximation method were employed to establish the luminance degradation model. The lumen maintenance data collected according to the IES LM-80-08 lumen maintenance test standard were fitted with and without error corrections, and the pseudo failure time of each HPWLED sample was extrapolated. The statistical analysis on the failure time was achieved by using Weibull distribution, normal distribution, lognormal distribution and Akaike Information Criterion (AIC). Then the life information was acquired. The results indicate that Weibull right approximation luminance degradation model (WRALDM) accurately reflects the variation of the lumen law with time. The failure time is accurately obtained. The best life distributions before and after the error correction to the lumen maintenance data are identified, based on AIC, as Weibull distribution and lognormal distribution, respectively. It is further confirmed by comparing the widths of life confidence interval and the life provided by the IES TM-21-11 method that the HPWLED life using WRALDM has a better accuracy. The optimized model provides researchers and manufacturers with significant guidelines for the further development of life prediction methodology. Highlights: Weibull right approximation luminance degradation model (WRALDM) was established. The HPWLED pseudo failure time extrapolated by WRALDM is more reliable. The predicted life in this work is the most accurate. The WRALDM with error correction is optimal. The optimized model improves the life prediction methods.