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APA Citation

    Xu, Y., Li, X., Zhu, L., & Zhang, J. (n.d.). defect modification in ZnInSnO transistor with solution-processed Al2O3 dielectric by annealing. Materials science in semiconductor processing, 46, 23–28. http://access.bl.uk/ark:/81055/vdc_100030795906.0x000004
  
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