Cite
MLA Citation
Zhang Yuqian and Fu Li. “Trapping and Detrapping Effects on Current Conduction Mechanisms at Interface of Au/HfO2 High-k Films.” Xi you jin shu cai liao yu gong cheng, vol. 44, no. 12, 2015, pp. 2992–2995. http://access.bl.uk/ark:/81055/vdc_100030952511.0x000025