Cite
MLA Citation
Xiaoliang Zhong et al.. “The effect of a Ta oxygen scavenger layer on HfO2-based resistive switching behavior: thermodynamic stability, electronic structure, and low-bias transport.” Physical chemistry chemical physics, vol. 18, no. 10, 2016, pp. 7502–7510. http://access.bl.uk/ark:/81055/vdc_100030944511.0x00002a