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APA Citation
Wang, X., Zhang, H., Ma, X., Cheng, Q., Li, C., Li, M., Chen, T., Zhang, P., & Shao, J. (2016). degradation behavior and mechanism of polymer films for high-ohmic resistor protection in a heat and humid environment. Microelectronics and reliability, 57, 79–85. http://access.bl.uk/ark:/81055/vdc_100030755427.0x00005a