Cite
HARVARD Citation
Wang, X. et al. (2016). Degradation behavior and mechanism of polymer films for high-ohmic resistor protection in a heat and humid environment. Microelectronics and reliability. pp. 79-85. [Online].
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Wang, X. et al. (2016). Degradation behavior and mechanism of polymer films for high-ohmic resistor protection in a heat and humid environment. Microelectronics and reliability. pp. 79-85. [Online].