Cite
MLA Citation
E.G. Ioannidis et al.. “Characterization and modeling of drain current local variability in 28 and 14 nm FDSOI nMOSFETs.” Solid-state electronics, vol. 118, 2016, pp. 4–11. http://access.bl.uk/ark:/81055/vdc_100030714134.0x00004b