Cite
HARVARD Citation
Ioannidis, E. et al. (2016). Characterization and modeling of drain current local variability in 28 and 14 nm FDSOI nMOSFETs. Solid-state electronics. pp. 4-11. [Online].
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Ioannidis, E. et al. (2016). Characterization and modeling of drain current local variability in 28 and 14 nm FDSOI nMOSFETs. Solid-state electronics. pp. 4-11. [Online].