Cite
HARVARD Citation
Morin, P. et al. (2016). A review of the mechanical stressors efficiency applied to the ultra-thin body & buried oxide fully depleted silicon on insulator technology. Solid-state electronics. pp. 100-116. [Online].
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Morin, P. et al. (2016). A review of the mechanical stressors efficiency applied to the ultra-thin body & buried oxide fully depleted silicon on insulator technology. Solid-state electronics. pp. 100-116. [Online].