Cite
HARVARD Citation
Theodorou, C. et al. (2016). Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature. Solid-state electronics. pp. 88-93. [Online].
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Theodorou, C. et al. (2016). Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature. Solid-state electronics. pp. 88-93. [Online].