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HARVARD Citation
Li, C. et al. (2016). Precise strain profile measurement as a function of depth in thermal barrier coatings using high energy synchrotron X-rays. Scripta materialia. pp. 122-126. [Online].
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Li, C. et al. (2016). Precise strain profile measurement as a function of depth in thermal barrier coatings using high energy synchrotron X-rays. Scripta materialia. pp. 122-126. [Online].