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APA Citation
Wang, Y., Sigle, W., Zhou, D., Baiutti, F., Logvenov, G., Gregori, G., Cristiani, G., Maier, J., & van Aken, P. (n.d.). atomic-Scale Quantitative and Analytical STEM Investigation of Sr-δ-Doped La2CuO4 Multilayers. Microscopy and microanalysis, 21, 2071–2072. http://access.bl.uk/ark:/81055/vdc_100029271650.0x000059