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APA Citation
Holm, J., & Keller, R. (n.d.). analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector*. Microscopy and microanalysis, 21, 1867–1868. http://access.bl.uk/ark:/81055/vdc_100029271631.0x000062