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APA Citation
Gan, Z., Gu, M., Tang, J., Wang, C. Y., Wang, K. L., Wang, C. M., Smith, D. J., & McCartney, M. R. (n.d.). characterization of Trapped Charge in Ge/LixGe Core/Shell Structure during Lithiation using Off-axis Electron Holography. Microscopy and microanalysis, 21, 1397–1398. http://access.bl.uk/ark:/81055/vdc_100029271568.0x00003c