Cite
MLA Citation
Christian Lang et al.. “Characterization of Layer Thickness and Orientation of 2D WSe2/MoS2 Heterostructures using EDS, EBSD and AFM.” Microscopy and microanalysis, vol. 21, n.d., pp. 103–104. http://access.bl.uk/ark:/81055/vdc_100029267032.0x000052