Cite
MLA Citation
M. Gao et al.. “Chemical and mechanical strains tuned dielectric properties in Zr-doped CaCu3Ti4O12 highly epitaxial thin films.” RSC advances, vol. 5, no. 113, 2015, pp. 92958–92962. http://access.bl.uk/ark:/81055/vdc_100029784910.0x00000b