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APA Citation
Körsgen, M., Pelster, A., Vens‐Cappell, S., Roling, O., & Arlinghaus, H. F. (2016). molecular ME‐ToF‐SIMS yield as a function of DHB matrix layer thicknesses obtained from brain sections coated by sublimation/deposition techniques. Surface and interface analysis, 48, 34–39. http://access.bl.uk/ark:/81055/vdc_100028061595.0x000050