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MLA Citation
B. K. Tanner et al.. “X‐ray asterism and the structure of cracks from indentations in silicon.” Journal of applied crystallography, vol. 49, n.d., pp. 250–259. http://access.bl.uk/ark:/81055/vdc_100028645678.0x00004d
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B. K. Tanner et al.. “X‐ray asterism and the structure of cracks from indentations in silicon.” Journal of applied crystallography, vol. 49, n.d., pp. 250–259. http://access.bl.uk/ark:/81055/vdc_100028645678.0x00004d