Cite
HARVARD Citation
Villacorta, H. et al. (2015). Low VDD and body bias conditions for testing bridge defects in the presence of process variations. Microelectronics journal. 46 (5), pp. 398-403. [Online].
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Villacorta, H. et al. (2015). Low VDD and body bias conditions for testing bridge defects in the presence of process variations. Microelectronics journal. 46 (5), pp. 398-403. [Online].