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Wan, X. et al. (n.d.). Charge deposition model for investigating SE-microdose effect in trench power MOSFETs. Journal of semiconductors. pp. 2181-. [Online].
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Wan, X. et al. (n.d.). Charge deposition model for investigating SE-microdose effect in trench power MOSFETs. Journal of semiconductors. pp. 2181-. [Online].