Cite
APA Citation
Dupraz, M., Beutier, G., Rodney, D., Mordehai, D., & Verdier, M. (n.d.). signature of dislocations and stacking faults of face‐centred cubic nanocrystals in coherent X‐ray diffraction patterns: a numerical study. Journal of applied crystallography, 48, 621–644. http://access.bl.uk/ark:/81055/vdc_100025907234.0x000052