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APA Citation
Karim, W., Tschupp, S. A., Oezaslan, M., Schmidt, T. J., Gobrecht, J., van Bokhoven, J. A., & Ekinci, Y. (2015). high-resolution and large-area nanoparticle arrays using EUV interference lithography1. Nanoscale, 7(16), 7386–7393. http://access.bl.uk/ark:/81055/vdc_100025891579.0x000017