Cite

MLA Citation

    Davide Bisi et al.. “Trapping mechanisms in GaN‐based MIS‐HEMTs grown on silicon substrate.” Physica status solidi, vol. 212, no. 5, n.d., pp. 1122–1129. http://access.bl.uk/ark:/81055/vdc_100025887141.0x000020
  
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