Cite
APA Citation
Weiss Brennan, C. V., Walck, S. D., & Swab, J. J. (n.d.). a Multi-Step Transmission Electron Microscopy Sample Preparation Technique for Cracked, Heavily Damaged, Brittle Materials. Microscopy and microanalysis, 20, 1646–1653. http://access.bl.uk/ark:/81055/vdc_100025205004.0x000037