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APA Citation
Vanhellemont, J., Anada, S., Nagase, T., Yasuda, H., Bender, H., Rooyackers, R., & Vandooren, A. (n.d.). in situ UHVEM irradiation study of intrinsic point defect behavior in Si nanowire structures. Physica status solidi, 12(3), 275–281. http://access.bl.uk/ark:/81055/vdc_100025144219.0x00003c