Cite
HARVARD Citation
Vanhellemont, J. et al. (n.d.). In situ UHVEM irradiation study of intrinsic point defect behavior in Si nanowire structures. Physica status solidi. 12 (3), pp. 275-281. [Online].
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Vanhellemont, J. et al. (n.d.). In situ UHVEM irradiation study of intrinsic point defect behavior in Si nanowire structures. Physica status solidi. 12 (3), pp. 275-281. [Online].