Influence of Annealing on the Stress‐Assisted Two‐Way Memory Effect in Cold‐Worked NiTi Wire1. Issue 2 (2nd July 2014)

• Record Type: Journal Article
• Authors: Yan, Xiaojun; Ge, Yuli; Van Humbeeck, Jan
• Is Part Of: Advanced engineering materials. Volume 17:Issue 2(2015:Feb.)
• Page Start: 162
• Page End: 166
• Publication Date: 2014-07-02
• Subjects: Materials -- Periodicals; 620.11
• DOI: 10.1002/adem.201400156
• Languages: English
• ISSNs: 1438-1656

Abstract

<abstract abstract-type="graphical" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>The magnitude of stress‐assisted two‐way memory effect (SATWME) in NiTi alloys is affected by many factors and the mechanism of the development of SATWME is not been explored in depth. The influence of annealing on SATWME is investigated in a cold‐worked NiTi alloy by using a dynamic mechanical analyzer. Some new results are presented. <boxed-text content-type="graphic" position="anchor" orientation="portrait"><graphic position="anchor" mimetype="image" xlink:href="ark:/27927/pgjf85cmr6" orientation="portrait" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /></boxed-text></p> </abstract>