Cite
HARVARD Citation
Yan, X. et al. (n.d.). Influence of Annealing on the Stress‐Assisted Two‐Way Memory Effect in Cold‐Worked NiTi Wire1. Advanced engineering materials. 17 (2), pp. 162-166. [Online].
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Yan, X. et al. (n.d.). Influence of Annealing on the Stress‐Assisted Two‐Way Memory Effect in Cold‐Worked NiTi Wire1. Advanced engineering materials. 17 (2), pp. 162-166. [Online].