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APA Citation
Mastromatteo, M., Arduca, E., Napolitani, E., Nicotra, G., De Salvador, D., Bacci, L., Frascaroli, J., Seguini, G., Scuderi, M., Impellizzeri, G., Spinella, C., Perego, M., Carnera, A., Lee, Y., Moon, D., Kang, H. J., Kim, K. J., Lee, T. G., Lee, J. C., Yi, K., & Hong, T. E. (n.d.). quantification of phosphorus diffusion and incorporation in silicon nanocrystals embedded in silicon oxide. Surface and interface analysis, 46, 393–396. http://access.bl.uk/ark:/81055/vdc_100024984730.0x000008